Towards artifact-free characterization of surface topography using complex wavelets and total variation minimization

DOI10.1016/j.amc.2004.12.053zbMath1103.86001OpenAlexW2013313020MaRDI QIDQ2573567

Jianwei Ma

Publication date: 22 November 2005

Published in: Applied Mathematics and Computation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.amc.2004.12.053

zbMATH Keywords

Total variationFeature extractionDenoisingComplex wavelet transformSurface characterization

Mathematics Subject Classification ID

Signal theory (characterization, reconstruction, filtering, etc.) (94A12) Geodesy, mapping problems (86A30)

Related Items (1)

Tetrolet shrinkage with anisotropic total variation minimization for image approximation

Uses Software

• DT-CWT

Cites Work

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