Towards artifact-free characterization of surface topography using complex wavelets and total variation minimization (Q2573567)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Towards artifact-free characterization of surface topography using complex wavelets and total variation minimization |
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Towards artifact-free characterization of surface topography using complex wavelets and total variation minimization (English)
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22 November 2005
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Complex wavelet transform
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Total variation
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Surface characterization
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Denoising
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Feature extraction
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