Easily tested circuits for linear functions

DOI10.3103/S0027132211040097MaRDI QIDQ2513230zbMATH OpenOpenAlexFDO

Authors S. R. Bedzhanova

Publication date 2 February 2015

Published in Moscow University Mathematics Bulletin (Search for Journal in Brave)

Full work available at URL https://doi.org/10.3103/s0027132211040097

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Recommendations

• Converting circuits of functional elements into easily testable forms
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Cited in

(4)

• Diagnostic tests for discrete functions defined on rings
• Short complete diagnostic tests for circuits implementing linear Boolean functions
• On checking tests for a parity counter
• Fault detection tests for stuck-at faults on parity counter inputs

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