Design of easily testable combinational circuits
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Cited in
(29)- Constructing self-testing circuits with the use of step-by-step (cascade) control
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- Checking combinational circuits by means of functional indices
- Construction of code-disjoint self-parity combinational circuits for self-testing and functional diagnosis
- Testable circuit design for ring testing
- Improving estimates of parameters and shortening the procedure for constructing efficient diagnostic polynomials.
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
- Easily testable realization of a circuit on the basis of polynomial representation of output functions
- Logic complement, a new method of checking the combinational circuits
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- Detection of faults in combinational circuits by a self-dual test
- Easily tested circuits for linear functions
- Checking combinational circuits by the method of logic complement
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- Optimal design of hazard-free and easily testable logic networks
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- The Complexity of Fault Detection Problems for Combinational Logic Circuits
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- Functional diagnosis of combinational circuits by compact testing methods
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