Generalized confidence intervals for comparing the capability of two processes
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Recommendations
- Estimation of differences between process capability indices \(C_{pm}\) or \(C_{pmk}\) for two processes
- Confidence intervals for the capability indices \(C_{pm}\) and \(C_{pmk}\) in stationary Caussian processes
- Bayesian testing for process capability indices
- Sample size determination for the estimate of process capability indices
- Generalized confidence intervals for the process capability index \(C_{pm}\)
Cites work
- Bootstrap approach for supplier selection based on production yield
- Bootstrap methods: another look at the jackknife
- Distribution and moments in simplified form for a general class of capability indices
- Generalized Confidence Intervals
- scientific article; zbMATH DE number 708500 (Why is no real title available?)
- scientific article; zbMATH DE number 718888 (Why is no real title available?)
- scientific article; zbMATH DE number 952740 (Why is no real title available?)
- scientific article; zbMATH DE number 2115283 (Why is no real title available?)
- Selecting the largest capability index from several quality control processes
- Tests of Coefficients of Variation of Normal Population
- The asymptotic distribution of the process capability indexCpmk
- The probability density function of process capability index Cpmk
Cited in
(8)- Process improvement capability index with cost -- a modeling method of mathematical programming
- Process performance evaluation based on Taguchi capability index with the consideration of measurement errors
- Reliable confidence intervals for assessing normal process incapability
- Comparing multiple process overall yields from multiple manufacturing lines
- scientific article; zbMATH DE number 2205585 (Why is no real title available?)
- Comparison of two processes based on quantile-based process capability indices by using fiducial generalized confidence interval
- A cost-effective sampling strategy by variables inspection for lot disposition
- Generalized confidence intervals for process capability indices in the one-way random model
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