High Quality Test Pattern Generation and Boolean Satisfiability

DOI10.1007/978-1-4419-9976-4MaRDI QIDQ3106263zbMATH OpenOpenAlexWikidataFDO

Authors Stephan Eggersglüß, Rolf Drechsler

Publication date 20 December 2011

Full work available at URL https://doi.org/10.1007/978-1-4419-9976-4

zbMATH Keywords

Boolean satisfiabilityautomatic test pattern generation

Mathematics Subject Classification ID

Research exposition (monographs, survey articles) pertaining to computer science (68-02) Problem solving in the context of artificial intelligence (heuristics, search strategies, etc.) (68T20) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12) Mathematical problems of computer architecture (68M07)

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Cited in

(7)

• Formal Methods for Hardware Verification
• A novel RTL behavioral description based ATPG method
• Thread-parallel integrated test pattern generator utilizing satisfiability analysis
• TG-Pro: A SAT-based ATPG system
• Test Pattern Generation using Boolean Proof Engines
• High-level test synthesis: a survey
• High-level synthesis techniques for functional test pattern execution

Describes a project that uses

Uses Software

• SATIRE

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