Functional test generation using binary decision diagrams (Q1101072)
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scientific article; zbMATH DE number 4045657
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| English | Functional test generation using binary decision diagrams |
scientific article; zbMATH DE number 4045657 |
Statements
Functional test generation using binary decision diagrams (English)
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1987
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fault detection
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extension to the D-algorithm
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integrated circuits
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binary decision diagrams
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LSI/VLSI circuit
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network of interconnected modules
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