Selective I/O scan: A diagnosable design technique for VLSI systems (Q1101076)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Selective I/O scan: A diagnosable design technique for VLSI systems |
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Selective I/O scan: A diagnosable design technique for VLSI systems (English)
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1987
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fault diagnosis
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test point placement algorithm
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VLSI
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