Selective I/O scan: A diagnosable design technique for VLSI systems
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Publication:1101076
DOI10.1016/0898-1221(87)90078-2zbMath0641.94037OpenAlexW2066503614MaRDI QIDQ1101076
Publication date: 1987
Published in: Computers \& Mathematics with Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/0898-1221(87)90078-2
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