BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count (Q1433981)
From MaRDI portal
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count |
scientific article |
Statements
BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count (English)
0 references
1 July 2004
0 references
0 references
