Testable Realizations for FET Stuck-Open Faults in CMOS Combinational Logic Circuits (Q3716977)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Testable Realizations for FET Stuck-Open Faults in CMOS Combinational Logic Circuits |
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Testable Realizations for FET Stuck-Open Faults in CMOS Combinational Logic Circuits (English)
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1986
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test invalidation
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testable designs
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