Exploiting deterministic TPG for path delay testing (Q1587342)
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scientific article; zbMATH DE number 1533049
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| default for all languages | No label defined |
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| English | Exploiting deterministic TPG for path delay testing |
scientific article; zbMATH DE number 1533049 |
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Exploiting deterministic TPG for path delay testing (English)
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20 November 2000
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test pattern generator
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path delay faults
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linear feedback shift register
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0.7868783473968506
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0.7222309708595276
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0.7205352783203125
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0.7067047953605652
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