Transmission eigenvalues with artificial background for explicit material index identification (Q1636152)

The authors consider a method to obtain information on the refractive index \(n\) of an inclusion embedded in a reference medium from the farfield data \(F\) of scattered plane waves (an exact a priori knowledge of the support of the inclusion is not required). It is possible to determine transmission eigenvalues (in short: TEs) from these data which contain informations on the material properties. \vskip 0.8em The determination of quantitative features from these TEs is complicated. The authors propose to work with another farfield operator \({F}^{\text{art}}:=F-\tilde{F}\) instead, where \(\tilde{F}\) corresponds to an artificial background, i.e. reference medium, and can obtained by a rather direct calculation. The determination of the refractive index based on the TEs of \({F}^{\text{art}}\) is simpler as before. \vskip 0.8em The authors present two theorems and a numerical illustration. Also the choice of other artificial backgrounds is discussed and a monotone dependence of the eigenvalues on \(n\) is shown with the aid of a \(min\)-\(max\) formula.