Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model (Q2134375)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model |
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Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model (English)
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3 May 2022
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atomic force microscopy
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nanomechanical uncertainty analysis
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contact model
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elastic modulus
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force-displacement curve
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supervised machine learning
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