Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration (Q2168299)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration |
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Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration (English)
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31 August 2022
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perfectly conducting cracks
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bistatic measurement
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Bessel functions
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sampling-type algorithm
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simulation results
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