Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration

DOI10.1016/J.JCP.2022.111479OpenAlexW4288032470WikidataQ114163226 ScholiaQ114163226MaRDI QIDQ2168299FDOQ2168299

Authors: Sangwoo Kang, Mikyoung Lim, Won-Kwang Park 

Publication date: 31 August 2022

Published in: Journal of Computational Physics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jcp.2022.111479

zbMATH Keywords

simulation resultsBessel functionsperfectly conducting cracksbistatic measurementsampling-type algorithm

Mathematics Subject Classification ID

General topics in optics and electromagnetic theory (78Axx) Basic methods for problems in optics and electromagnetic theory (78Mxx) Miscellaneous topics in partial differential equations (35Rxx)

Cites Work

• Identification of planar cracks by complete overdetermined data: inversion formulae
• Imaging schemes for perfectly conducting cracks
• Asymptotic imaging of perfectly conducting cracks
• Inverse scattering from an open arc
• Crack reconstruction using a level-set strategy
• Asymptotic properties of MUSIC-Type Imaging in Two-Dimensional Inverse Scattering from Thin Electromagnetic Inclusions
• Multi-frequency subspace migration for imaging of perfectly conducting, arc-like cracks in full- and limited-view inverse scattering problems
• Fast identification of cracks using higher-order topological sensitivity for 2-D potential problems
• Detection of surface breaking cracks in two dimensions
• Special section: Testing inversion algorithms against experimental data
• The factorization method for cracks in elastic scattering
• The factorization method for cracks in inhomogeneous media.
• Performance analysis of multi-frequency topological derivative for reconstructing perfectly conducting cracks
• Direct sampling method for retrieving small perfectly conducting cracks
• Revealing cracks inside conductive bodies by electric surface measurements

Cited In (4)

• Identification of cracks with non linear impedances
• Application of the linear sampling method to identify cracks with impedance boundary conditions
• Fast imaging of partially conductive linear cracks using impedance data
• Inverse parameter and shape problem for an isotropic scatterer with two conductivity coefficients

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