Two-grid method for semiconductor device problem by mixed finite element method and characteristics finite element method (Q2220728)
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scientific article; zbMATH DE number 7300786
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| English | Two-grid method for semiconductor device problem by mixed finite element method and characteristics finite element method |
scientific article; zbMATH DE number 7300786 |
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Two-grid method for semiconductor device problem by mixed finite element method and characteristics finite element method (English)
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25 January 2021
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semiconductor device
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two-grid method
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mixed finite element method
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characteristics finite element method
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\(L^q\) error estimates
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0.9193986654281616
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0.8677423000335693
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0.839286208152771
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