High-precision extraction of segment points of 2D profiles based on a dynamic grid method (Q2298151)

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High-precision extraction of segment points of 2D profiles based on a dynamic grid method
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    High-precision extraction of segment points of 2D profiles based on a dynamic grid method (English)
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    20 February 2020
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    Summary: In order to improve the reconstruction precision and performance of 2D profiles, this paper presents a new high-precision extraction method of segment points of 2D profile features. Firstly, we extract the intervals which include initial segment points based on the curvature information of data points. Secondly, a grid is dynamically constructed in the interval and all the nodes of the grid are considered as candidate segment points for an optimization process. Thirdly, the optimization model of each feature curve is constructed on the basis of boundary constraints. Selection of the optimal segment point is related to two factors: the number of control points of B-spline and the total approximation error of all collected points to the fitted curves. Numerical experiments were conducted and the results demonstrate the efficacy of our method in capturing design intent and in industrial applications, compared to existing methods.
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