Parametric fault diagnosis of analog circuits based on a semi-supervised algorithm (Q2311025)
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English | Parametric fault diagnosis of analog circuits based on a semi-supervised algorithm |
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Parametric fault diagnosis of analog circuits based on a semi-supervised algorithm (English)
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10 July 2019
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Summary: The parametric fault diagnosis of analog circuits is very crucial for condition-based maintenance (CBM) in prognosis and health management. In order to improve the diagnostic rate of parametric faults in engineering applications, a semi-supervised machine learning algorithm was used to classify the parametric fault. A lifting wavelet transform was used to extract fault features, a local preserving mapping algorithm was adopted to optimize the Fisher linear discriminant analysis, and a semi-supervised cooperative training algorithm was utilized for fault classification. In the proposed method, the fault values were randomly selected as training samples in a range of parametric fault intervals, for both optimizing the generalization of the model and improving the fault diagnosis rate. Furthermore, after semi-supervised dimensionality reduction and semi-supervised classification were applied, the diagnosis rate was slightly higher than the existing training model by fixing the value of the analyzed component.
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fault diagnosis
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lifting wavelet
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local preserving projection
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Fisher linear discriminant analysis
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semi-supervised random forest
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