Pseudorandom test pattern generators for built-in self-testing: a power reduction method (Q2487656)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Pseudorandom test pattern generators for built-in self-testing: a power reduction method |
scientific article; zbMATH DE number 2193747
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Pseudorandom test pattern generators for built-in self-testing: a power reduction method |
scientific article; zbMATH DE number 2193747 |
Statements
Pseudorandom test pattern generators for built-in self-testing: a power reduction method (English)
0 references
8 August 2005
0 references
0.7873374223709106
0 references
0.7770667672157288
0 references
0.7661466598510742
0 references
0.7412118315696716
0 references
0.7298825979232788
0 references