Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry (Q2489201)
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scientific article; zbMATH DE number 5023482
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| English | Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry |
scientific article; zbMATH DE number 5023482 |
Statements
Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry (English)
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16 May 2006
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Stochastic re-entrant
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Approximate mean value analysis
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Environmental stress testing
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Mean waiting time
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Mean throughput rate
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0.7016315460205078
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0.6942393183708191
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0.6870542168617249
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0.6564667224884033
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