Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry (Q2489201)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry |
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Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry (English)
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16 May 2006
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Stochastic re-entrant
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Approximate mean value analysis
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Environmental stress testing
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Mean waiting time
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Mean throughput rate
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