Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry
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Publication:2489201
DOI10.1016/J.AMC.2005.04.050zbMATH Open1136.82381OpenAlexW1987534294MaRDI QIDQ2489201FDOQ2489201
Authors: Mohamed Khaled Omar, Suresh Kumar 
Publication date: 16 May 2006
Published in: Applied Mathematics and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.amc.2005.04.050
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- scientific article; zbMATH DE number 4106588
Mean waiting timeApproximate mean value analysisEnvironmental stress testingMean throughput rateStochastic re-entrant
Cites Work
- Mean-Value Analysis of Closed Multichain Queuing Networks
- Queueing theory in manufacturing systems analysis and design: A classification of models for production and transfer lines
- A Proof for the Queuing Formula: L = λW
- Mean value analysis of re-entrant line with batch machines and multi-class jobs
- Performance analysis of scheduling policies in re-entrant manufacturing systems
- Asymptotic loss of priority scheduling policies in closed re-entrant lines: A computational study
- A dynamic-server queuing simulation.
- The design of robotic dairy barns using closed queueing networks
- Optimal Server Acquisition in Open Queueing Networks
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