Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry

DOI10.1016/J.AMC.2005.04.050MaRDI QIDQ2489201zbMATH OpenOpenAlexFDO

Authors Mohamed Khaled Omar, Suresh Kumar

Publication date 16 May 2006

Published in Applied Mathematics and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.amc.2005.04.050

zbMATH Keywords

Mean waiting timeApproximate mean value analysisEnvironmental stress testingMean throughput rateStochastic re-entrant

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37)

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Cites work

• A Proof for the Queuing Formula: L = λW
• A dynamic-server queuing simulation.
• Asymptotic loss of priority scheduling policies in closed re-entrant lines: A computational study
• Mean value analysis of re-entrant line with batch machines and multi-class jobs
• Mean-Value Analysis of Closed Multichain Queuing Networks
• Optimal Server Acquisition in Open Queueing Networks
• Performance analysis of scheduling policies in re-entrant manufacturing systems
• Queueing theory in manufacturing systems analysis and design: A classification of models for production and transfer lines
• The design of robotic dairy barns using closed queueing networks

Cited in

(1)

• Performance analysis in a re-entrant operation with combinational routing and yield probabilities

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