Improvement of the contraction-type LP test algorithm for finding all solutions of piecewise-linear resistive circuits (Q2764568)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Improvement of the contraction-type LP test algorithm for finding all solutions of piecewise-linear resistive circuits |
scientific article |
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Improvement of the contraction-type LP test algorithm for finding all solutions of piecewise-linear resistive circuits (English)
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1 May 2003
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