Locating multiple multiscale electromagnetic scatterers by a single far-field measurement (Q2873285)

The paper is concerned with the extension to a more practical setting of two imaging schemes proposed by two of the authors in a previous article [\textit{J. Li} et al., SIAM J. Appl. Math. 73, No. 4, 1721--1746 (2013; Zbl 1323.78012)]. They are imaging schemes that use a single far-field measurement for locating multiple electromagnetic scatterers of regular size (scheme R) or small size (scheme S) compared with the wavelength of the incident wave. The authors extend scheme R by relaxing the requirement on a priori knowledge of possible shape, orientation and size of the scatterers. Then, using this extension of scheme R and scheme S, they develop a new imaging scheme for locating multiple multi-scale scatterers which include both regular-size and small-size components. A novel local re-sampling method is proposed as an effective a posteriori position-fine-tuning method and the use of two far-field measurements provides a more robust and accurate locating of the multi-scale scatterers. The paper includes numerical simulations of several benchmark problems to illustrate the efficiency of the new methods.