Sampling in flat detector fan beam tomography (Q2884615)

In fan beam tomography, functions in \(\mathbb {R}^2\) are reconstructed from integrals along rays which emanate from source points on a circle exterior to the object. The ray from each source can be parameterized either by the angle subtended with the ray through the origin or by the location of intersection with a line through the origin perpendicular to the central ray. The former models a curved detector and the latter a flat detector. Requirements for reconstructing an essentially bandlimited function from regular samples acquired with a curved detector are well known [\textit{F. Natterer}, SIAM J. Appl. Math. 53, No. 2, 358--380 (1993; Zbl 0773.65089)]. These results are extended to the flat detector. The essential bandregion of flat fan beam transform of an essentially bandlimited function is computed and shown to be a superset of the scaled version of the corresponding bandregion of the curved fan beam transform of the function. Sampling conditions for the flat fan beam transform follow and differ from those appearing in the literature [\textit{F. Natterer} and \textit{F. Wübbeling}, Mathematical methods in image reconstruction. SIAM Monographs on Mathematical Modeling and Computation. 5. Philadelphia, PA: SIAM (2001; Zbl 0974.92016)].