The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device (Q3112435)
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scientific article; zbMATH DE number 5995978
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| English | The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device |
scientific article; zbMATH DE number 5995978 |
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The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device (English)
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10 January 2012
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semiconductor device
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domain decomposition
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method of characteristics
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mixed finite element method
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parallel arithmetic
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\(L^{2}\) error estimate
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0.92160875
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0.91296315
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0.90109205
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0.8936145
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0.89220786
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