The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device
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Publication:3112435
DOI10.1002/num.20625zbMath1231.82086MaRDI QIDQ3112435
Publication date: 10 January 2012
Published in: Numerical Methods for Partial Differential Equations (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/num.20625
domain decomposition; method of characteristics; mixed finite element method; semiconductor device; parallel arithmetic; \(L^{2}\) error estimate
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