The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device

From MaRDI portal

(Redirected from The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device)

Jump to:navigation, search

WARNING: Page is not linked to a MaRDI-Entity. Please add Sitelink / Wikibase-link.

Retrieved from "https://portal.mardi4nfdi.de/w/index.php?title=The_modified_method_of_characteristics_with_mixed_finite_element_domain_decomposition_procedures_for_the_transient_behavior_of_a_semiconductor_device&oldid=80188757"