The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device
domain decompositionmixed finite element methodsemiconductor devicemethod of characteristicsparallel arithmetic\(L^{2}\) error estimate
Electro- and magnetostatics (78A30) Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs (65M12) Numerical aspects of the method of characteristics for initial value and initial-boundary value problems involving PDEs (65M25) Multigrid methods; domain decomposition for initial value and initial-boundary value problems involving PDEs (65M55) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Statistical mechanics of semiconductors (82D37)
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