scientific article; zbMATH DE number 4016133
convergencefive-point difference methodimplicit finite difference methodmethod of characteristicspotential equationquasilinearsemiconductor device
Partial differential equations of mathematical physics and other areas of application (35Q99) Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs (65M12) Numerical aspects of the method of characteristics for initial value and initial-boundary value problems involving PDEs (65M25) Applications to the sciences (65Z05) Motion of charged particles (78A35) Technical applications of optics and electromagnetic theory (78A55)
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- scientific article; zbMATH DE number 4016132
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- A finite difference scheme for a semiconductor device problem on grids with local refinement in time and space
- Discrete-time methods for equations modelling transport of foreign-atoms in semiconductors
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- Superconvergence analysis of finite element method for nonlinear semiconductor device problem
- Mathematical Model, Numerical Simulation and Convergence Analysis of a Semiconductor Device Problem with Heat and Magnetic Influences
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- Upwind block-centered multistep differences for semiconductor device problem with heat and magnetic influences
- Analysis on block-centered finite differences of numerical simulation of semiconductor device detector
- Mathematical model, block-centered difference and numerical analysis on changing meshes of semiconductor device problem with heat and magnetic influences
- An upwind-block-centered multistep difference method for a semiconductor device and numerical analysis
- Superconvergence analysis of low order nonconforming finite element method for coupled nonlinear semiconductor device problem
- A finite volume element scheme modified with second-order upwind fractional step of three-dimensional semiconductor device transient behavior and its convergence analysis
- Numerical method and analysis of computational fluid mechanics for photoelectric semiconducting detector
- Analysis of a two-grid method for semiconductor device problem
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