Design of test sequences for VLSI self-testing using LFSR (Q3484763)
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scientific article; zbMATH DE number 4156357
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| English | Design of test sequences for VLSI self-testing using LFSR |
scientific article; zbMATH DE number 4156357 |
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Design of test sequences for VLSI self-testing using LFSR (English)
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1990
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linear feedback shift register
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maximum length
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VLSI self-testing
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0.8173556923866272
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0.7734222412109375
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0.7624863386154175
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0.7547039985656738
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