Design of test sequences for VLSI self-testing using LFSR (Q3484763)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Design of test sequences for VLSI self-testing using LFSR |
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Design of test sequences for VLSI self-testing using LFSR (English)
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1990
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linear feedback shift register
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maximum length
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VLSI self-testing
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