Design of test sequences for VLSI self-testing using LFSR

DOI10.1109/18.52485MaRDI QIDQ3484763zbMATH OpenOpenAlexFDO

Authors Henk D. L. Hollmann

Publication date 1990

Published in IEEE Transactions on Information Theory (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/18.52485

zbMATH Keywords

linear feedback shift registermaximum lengthVLSI self-testing

Mathematics Subject Classification ID

Communication, information (94A99) Fault detection; testing in circuits and networks (94C12)

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• Proof of a conjecture and a bound on the imbalance properties of LFSR subsequences
• Theoretical properties of LFSRs for built-in self test
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