Design of test sequences for VLSI self-testing using LFSR

DOI10.1109/18.52485MaRDI QIDQ3484763zbMATH OpenOpenAlexFDO

Authors Henk D. L. Hollmann

Publication date 1990

Published in IEEE Transactions on Information Theory (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/18.52485

zbMATH Keywords

maximum lengthlinear feedback shift registerVLSI self-testing

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Communication, information (94A99)

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• Zero-aliasing for modeled faults
• Test-set partitioning for multi-weighted random LFSRs
• Design of universal test sequences for VLSI
• Proof of a conjecture and a bound on the imbalance properties of LFSR subsequences
• The estimates of trigonometric sums and new bounds on a mean value, a sequence and a cryptographic function
• scientific article; zbMATH DE number 436498 (Why is no real title available?)

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