Zero-aliasing for modeled faults

DOI10.1109/12.475124MaRDI QIDQ4421145zbMATH OpenOpenAlexFDO

Authors Mody Lempel, Sandeep K. Gupta

Publication date 1995

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://semanticscholar.org/paper/3d913908a81c1e76a456263ddc362652caede4e1

zbMATH Keywords

VLSI circuitssignature analysisBuilt-In Self-Test

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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