Study on automatic test generation for logical circuits based on genetic algorithms (Q3500899)
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scientific article; zbMATH DE number 5283689
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| English | Study on automatic test generation for logical circuits based on genetic algorithms |
scientific article; zbMATH DE number 5283689 |
Statements
3 June 2008
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genetic algorithms
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test pattern generation
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fault simulation
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0.7745345234870911
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0.7473255395889282
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0.7346104383468628
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0.7334540486335754
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