Study on automatic test generation for logical circuits based on genetic algorithms

MaRDI QIDQ3500899zbMATHFDO

Authors Yonggang Li, Yaqi Wan, Rui Li

Publication date 3 June 2008

zbMATH Keywords

genetic algorithmsfault simulationtest pattern generation

Mathematics Subject Classification ID

Approximation methods and heuristics in mathematical programming (90C59) Approximation algorithms (68W25) Fault detection; testing in circuits and networks (94C12)

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