Study on automatic test generation for logical circuits based on genetic algorithms

zbMATH Open1150.94346MaRDI QIDQ3500899FDOQ3500899

Authors: Yonggang Li, Yaqi Wan, Rui Li 

Publication date: 3 June 2008

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zbMATH Keywords

genetic algorithmsfault simulationtest pattern generation

Mathematics Subject Classification ID

Approximation methods and heuristics in mathematical programming (90C59) Approximation algorithms (68W25) Fault detection; testing in circuits and networks (94C12)

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• Test generation of the digital circuits based on the genetic algorithms
• Title not available (Why is that?)
• Generating test patterns for FPGA circuits: a quantum computing approach
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• Markov modelling and parameterisation of genetic evolutionary test generations

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