Large-scale transient sensitivity analysis of a radiation-damaged bipolar junction transistor via automatic differentiation (Q3528802)
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scientific article; zbMATH DE number 5353289
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| English | Large-scale transient sensitivity analysis of a radiation-damaged bipolar junction transistor via automatic differentiation |
scientific article; zbMATH DE number 5353289 |
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17 October 2008
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sensitivity analysis
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radiation damage
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bipolar junction transistor
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forward mode
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Trilinos
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Sacado
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Rythmos
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0.7367582321166992
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0.7357176542282104
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0.7322351932525635
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