Large-scale transient sensitivity analysis of a radiation-damaged bipolar junction transistor via automatic differentiation

MaRDI QIDQ3528802zbMATH OpenFDO

Authors Eric T. Phipps, Roscoe A. Bartlett, David M. Gay, Robert J. Hoekstra

Publication date 17 October 2008

zbMATH Keywords

sensitivity analysisradiation damageforward modebipolar junction transistorRythmosSacadoTrilinos

Mathematics Subject Classification ID

Sensitivity, stability, parametric optimization (90C31) Iterative numerical methods for linear systems (65F10) Numerical differentiation (65D25) Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory (78M10) Software, source code, etc. for problems pertaining to optics and electromagnetic theory (78-04) Optimization problems in optics and electromagnetic theory (78M50)

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Cited in

(4)

• Using computational singular perturbation as a diagnostic tool in ODE and DAE systems: a case study in heterogeneous catalysis
• A backward automatic differentiation framework for reservoir simulation
• Automatic differentiation of C++ codes on emerging manycore architectures with Sacado
• Expression templates for primal value taping in the reverse mode of algorithmic differentiation

Describes a project that uses

Uses Software

• Rythmos
• TFad
• Sacado
• Trilinos
• ALBERTA
• SUNDIALS

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