Large-scale transient sensitivity analysis of a radiation-damaged bipolar junction transistor via automatic differentiation
zbMATH Open1147.78003MaRDI QIDQ3528802FDOQ3528802
David M. Gay, Robert J. Hoekstra, Eric T. Phipps, Roscoe A. Bartlett
Publication date: 17 October 2008
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Sensitivity, stability, parametric optimization (90C31) Iterative numerical methods for linear systems (65F10) Numerical differentiation (65D25) Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory (78M10) Software, source code, etc. for problems pertaining to optics and electromagnetic theory (78-04) Optimization problems in optics and electromagnetic theory (78M50)
Cited In (4)
- Using computational singular perturbation as a diagnostic tool in ODE and DAE systems: a case study in heterogeneous catalysis
- A backward automatic differentiation framework for reservoir simulation
- Automatic differentiation of C++ codes on emerging manycore architectures with Sacado
- Expression templates for primal value taping in the reverse mode of algorithmic differentiation
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