Localization and quantification of noise sources in four-gate field-effect-transistors (Q3585576)
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scientific article; zbMATH DE number 5773672
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| English | Localization and quantification of noise sources in four-gate field-effect-transistors |
scientific article; zbMATH DE number 5773672 |
Statements
Localization and quantification of noise sources in four‐gate field‐effect‐transistors (English)
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20 August 2010
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four-gate transistor
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low frequency noise
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multiple-gate transistor
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two-dimensional (2D) modeling
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junction FET (JFET)
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0.7191569209098816
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0.669096052646637
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0.6567932963371277
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0.6420919299125671
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