Localization and quantification of noise sources in four-gate field-effect-transistors
DOI10.1002/JNM.744zbMATH Open1196.82130OpenAlexW4229897054MaRDI QIDQ3585576FDOQ3585576
Authors: A. Luque Rodríguez, J. A. Jiménez Tejada, Andrés Godoy, J. A. López Villanueva, F. M. Gómez-Campos, S. Rodríguez-Bolívar 
Publication date: 20 August 2010
Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/jnm.744
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