Simulation of the hot-carrier degradation in short channel transistors with high-k dielectric (Q3585578)
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scientific article; zbMATH DE number 5773674
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| English | Simulation of the hot-carrier degradation in short channel transistors with high-k dielectric |
scientific article; zbMATH DE number 5773674 |
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Simulation of the hot‐carrier degradation in short channel transistors with high‐K dielectric (English)
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20 August 2010
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hot-carrier degradation
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high-k
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reliability
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short channel devices
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0.6648195385932922
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0.6427829265594482
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0.6363685727119446
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0.633418619632721
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