Estimation of thermal resistance distributions for die-attach testing in microelectronics (Q3604084)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 5510771
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Estimation of thermal resistance distributions for die-attach testing in microelectronics |
scientific article; zbMATH DE number 5510771 |
Statements
Estimation of thermal resistance distributions for die-attach testing in microelectronics (English)
0 references
24 February 2009
0 references
Inverse heat conduction
0 references
Microelectronics
0 references
Defect detection
0 references
Distribution estimation
0 references
0.7446841597557068
0 references
0.7386906743049622
0 references
0.7358945608139038
0 references
0.733928382396698
0 references
