Estimation of thermal resistance distributions for die-attach testing in microelectronics (Q3604084)
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scientific article; zbMATH DE number 5510771
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| English | Estimation of thermal resistance distributions for die-attach testing in microelectronics |
scientific article; zbMATH DE number 5510771 |
Statements
Estimation of thermal resistance distributions for die-attach testing in microelectronics (English)
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24 February 2009
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Inverse heat conduction
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Microelectronics
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Defect detection
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Distribution estimation
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0.7446841597557068
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0.7386906743049622
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0.7358945608139038
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0.733928382396698
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