A New Built-In Self-Test Design for PLA's with Hligh Fault Coverage and Low Overhead (Q3767267)
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scientific article; zbMATH DE number 4025343
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| English | A New Built-In Self-Test Design for PLA's with Hligh Fault Coverage and Low Overhead |
scientific article; zbMATH DE number 4025343 |
Statements
A New Built-In Self-Test Design for PLA's with Hligh Fault Coverage and Low Overhead (English)
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1987
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fault coverage
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fault models
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output response compression
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programmable logic array
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test pattern generation
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VLSI design
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built-in self-test design
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0.8605451583862305
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0.8012216687202454
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0.7896493673324585
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0.7744438648223877
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