Testing Memories for Single-Cell Pattern-Sensitive Faults (Q3869271)
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scientific article; zbMATH DE number 3672213
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| English | Testing Memories for Single-Cell Pattern-Sensitive Faults |
scientific article; zbMATH DE number 3672213 |
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Testing Memories for Single-Cell Pattern-Sensitive Faults (English)
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1980
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design of minimum-length test sequences
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pattern-sensitive fault
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fault detection
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memory testing
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polyominoes
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test generation
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random-access memory arrays
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0.784072995185852
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0.7798056602478027
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0.7475241422653198
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0.7446456551551819
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