Generation of shortest test sequences for detecting individual faults of sequential circuits (Q4178933)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Generation of shortest test sequences for detecting individual faults of sequential circuits |
scientific article; zbMATH DE number 3614677
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Generation of shortest test sequences for detecting individual faults of sequential circuits |
scientific article; zbMATH DE number 3614677 |
Statements
Generation of shortest test sequences for detecting individual faults of sequential circuits (English)
0 references
1979
0 references
Synchronous Sequential Circuits
0 references
Fault Detection
0 references
Shortest Test Sequences
0 references
Stuck-At Fault
0 references
Sequential Machine
0 references
