Generation of shortest test sequences for detecting individual faults of sequential circuits

DOI10.1093/COMJNL/22.2.169zbMATH Open0395.94040OpenAlexW2160227594MaRDI QIDQ4178933FDOQ4178933

Authors: Stephen S. Yau, Yushan Tang 

Publication date: 1979

Published in: The Computer Journal (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1093/comjnl/22.2.169

zbMATH Keywords

Fault DetectionSequential MachineShortest Test SequencesStuck-At FaultSynchronous Sequential Circuits

Mathematics Subject Classification ID

Formal languages and automata (68Q45)

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