Recovery of an interface from boundary measurement in an elliptic differential equation (Q421367)

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scientific article; zbMATH DE number 6038156
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    Recovery of an interface from boundary measurement in an elliptic differential equation
    scientific article; zbMATH DE number 6038156

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      Recovery of an interface from boundary measurement in an elliptic differential equation (English)
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      23 May 2012
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      Let \(\Omega\) be a smooth bounded domain in \(\mathbb R^{2}\) and \(S\subset \Omega\) a subdomain. This paper considers the elliptic boundary value problem \(\Delta u(x)=p(x)u(x)\) in \(\Omega\), \(\partial u(x )/\partial \nu=g(x)\) on \(\partial \Omega\), where \(\nu\) denotes the unit outward normal to \(\partial \Omega\) and \(p(x)=p_{0}\chi_{S}(x)\), which arises from a semiconductor transistor model. This paper studies the inverse problem of recovering an interior interface from a boundary measurement in this boundary value problem. The authors set up a nonlinear least-squares formulation for solving the inverse problem, and establish the necessary derivatives with respect to the interface. Then they propose both the Gauss-Newton iterative method and the conjugate gradient method for the least-squares problem and present implementation of these methods using integral equations.
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      elliptic boundary value problem
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      semiconductor transistor model
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      inverse problem
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      nonlinear least-squares
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      Gauss-Newton iterative method
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      conjugate gradient method
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