A backtracing-oriented procedure for the analysis of combinational gate-level designs (Q4332009)

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scientific article; zbMATH DE number 983686
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    A backtracing-oriented procedure for the analysis of combinational gate-level designs
    scientific article; zbMATH DE number 983686

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      A backtracing-oriented procedure for the analysis of combinational gate-level designs (English)
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      27 February 1997
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      Automatic test pattern generation
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      Backtracing
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      Circuit analysis
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      Design decomposition
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      Gate level design
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