No label defined (Q4373577)

The discussion in this paper has shown that random and, above all, constant measurement errors can considerably falsify the results of process capability analyses. This fact underlines the importance of ensuring gauge capability before evaluating process capability. In contrast to the indices \(C_{pm}\) and \(C_{pmk}\), for the \(C_{pk}\) index the extent of the process capability index (PCI) distortion due to a constant or a normally distributed measurement error only depends on one of the two distribution parameters of the normally distributed quality characteristic. Contrary to \(C_{pm}\) the relative change in \(C_{pk}\) induced by a fixed constant measurement error is not bounded. The discussion also illustrates that the \(C_{pk}\) index reacts more sensitively than the PCIs \(C_{pm}\) and \(C_{pmk}\) to normally distributed measurement errors. For the entire collection see [Zbl 0867.00026].