A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation (Q4384085)
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scientific article; zbMATH DE number 1143957
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation |
scientific article; zbMATH DE number 1143957 |
Statements
A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation (English)
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20 April 1998
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automatic test pattern generation
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very large scale integrated sequential circuit testing
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tour covering problem
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heuristics
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0.7981981039047241
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0.7694548964500427
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0.765279233455658
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0.7605083584785461
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0.7500431537628174
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