A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation (Q4384085)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation |
scientific article; zbMATH DE number 1143957
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation |
scientific article; zbMATH DE number 1143957 |
Statements
A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation (English)
0 references
20 April 1998
0 references
automatic test pattern generation
0 references
very large scale integrated sequential circuit testing
0 references
tour covering problem
0 references
heuristics
0 references
0.7981981039047241
0 references
0.7694548964500427
0 references
0.765279233455658
0 references
0.7605083584785461
0 references
0.7500431537628174
0 references
