Generation of high quality tests for robustly untestable path delay faults (Q4420784)
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scientific article; zbMATH DE number 1966745
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Generation of high quality tests for robustly untestable path delay faults |
scientific article; zbMATH DE number 1966745 |
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Generation of high quality tests for robustly untestable path delay faults (English)
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1996
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VLSI testing
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delay testing
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automatic test generation
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timing defects
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0.7746770977973938
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0.7703086137771606
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0.7476645112037659
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0.7435044646263123
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0.7389518022537231
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