A Selective Trigger Scan Architecture for VLSI Testing (Q4589553)
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scientific article; zbMATH DE number 6805687
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | A Selective Trigger Scan Architecture for VLSI Testing |
scientific article; zbMATH DE number 6805687 |
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A Selective Trigger Scan Architecture for VLSI Testing (English)
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10 November 2017
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