Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability (Q4883213)
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scientific article; zbMATH DE number 895098
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| English | Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability |
scientific article; zbMATH DE number 895098 |
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Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability (English)
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13 October 1996
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quality management
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screening
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empirical Bayes approach
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bad chips
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0.8981121778488159
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0.7572027444839478
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0.7395274639129639
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